L.K.J. Vandamme // Publications


Publications in international journals with referee system.

  1. L.K.J. Vandamme: 1/f Noise in homogeneous single crystals of III-V compounds. Phys. Lett. 49A (1974) 233-234.
  2. L.K.J. Vandamme: 1/f Noise of point contacts affected by uniform films. J. Appl. Phys 45 (1974) 4563-4565.
  3. L.K.J. Vandamme: 1/f Noise and constriction resistance of elongated contact spots. Electron. Lett. 12 (1976) 109-110.
  4. L.K.J. Vandamme, R.B. Tijburg: 1/f Noise measurements for characterizing multispot low- Ohmic contacts. J. Appl. Phys. 47 (1976) 2056-2058.
  5. L.H.F Ortmans, L.K.J. Vandamme: Characterization of impulse fritting procedures of contacts by measuring 1/f noise. Appl. Phys. 9 (1976) 147-151.
  6. L.K.J. Vandamme: On the calculation of 1/f noise of contacts. Appl. Phys. 11 (1976) 89-96.
  7. L.K.J. Vandamme: On 1/f noise in Ohmic contacts, proefschrift (PhD), Eindhoven University of Technology (1976).
  8. L.K.J. Vandamme: Criteria of low-noise thick-film resistors, Electrocom. Sci. Techn. 4 (1977) 171-177.
  9. L.K.J. Vandamme, W.M.G. van Bokhoven: Conductance noise investigation with four arbitrarily shaped and placed electrodes. Appl. Phys. 14 (1977) 205-215.
  10. L.K.J. Vandamme, J.C.F. Groot: 1/f Noise and resistance between circular electrodes. Electron. Lett. 14 (1978) 30-32.
  11. F.N. Hooge, L.K.J. Vandamme: Lattice scattering causes 1/f noise. Phys. Lett. 66A (1978) 315-316.
  12. J. Kedzia, L.K.J. Vandamme: 1/f Noise in liquid and solid Gallium, Phys. Lett. 66A (1978) 313-314.
  13. L.K.J. Vandamme, L.P.J. Kamp: Transverse and longitudinal noise. J. Appl. Phys. 50 (1979) 340-342.
  14. A.H. de Kuijper, L.K.J. Vandamme: Charts of spatial noise distribution in planar resistors with finite contacts, TH-Report 79-E-94, Eindhoven University of Technology, Dept. of Electr. Engineering Eindhoven, The Netherlands (1979), ISBN 90-6144-094-7, pp. 1-60.
  15. L.K.J. Vandamme, A.H de Kuijper: Conductance noise investigations on symmetrical planar resistors with finite contacts. Solid-State Electron. 22 (1979) 981-986.
  16. L.K.J. Vandamme, J. Kedzia: Concentration, mobility and 1/f noise of electrons and holes in thin Bismuth films. Thin Solid Films 65 (1980) 283-292.
  17. F.N. Hooge, J. Kedzia, L.K.J. Vandamme: Boundary scattering and 1/f noise. J. Appl. Phys. 50 (1979) 8087-8089.
  18. T.G.M. Kleinpenning, L.K.J. Vandamme: Comment on "Transverse 1/f noise in InSb thin films and the signal-to-noise ratio of related Hall elements". J. Appl. Phys. 50 (1979) 5547.
  19. L.K.J. Vandamme: Model for 1/f noise in MOS transistors biased in the linear region. Solid-State Electron. 23 (1980) 317-323.
  20. L.K.J. Vandamme, H.M.M. de Werd: 1/f noise model for MOSTs biased in nonohmic region, Solid-State Electron. 23 (1980) 325-329.
  21. G.W.M. Coppus, L.K.J. Vandamme: Spreading resistance and 1/f noise of embedded ellipsoidal electrodes in a conductor. Appl. Phys. 20 (1979) 119-123.
  22. L.K.J. Vandamme, J.C. Brugman: Conduction mechanisms in ZnO varistors. J. Appl. Phys. 51 (1980) 4240-4244.
  23. T.G.M. Kleinpenning, L.K.J. Vandamme: Model for 1/f noise in metaloxide- semiconductor transistors. J. Appl. Phys. 52 (1981) 1594-1596.
  24. F.N. Hooge, T.G.M. Kleinpenning, L.K.J. Vandamme: Experimental studies on 1/f noise. Rep. Prog. Phys. 44 (1981) 497-532.
  25. H.S. Ahluwalia, E.J.P. May, L.K.J. Vandamme: Second and third harmonic generation in the presence of a direct current. J. Appl. Phys. 53 (1982) 6482-6484.
  26. L.K.J. Vandamme, A. Douib: Specific contact resistance and noise in contacts on thin layers. Solid-State Electron. 25 (1982) 1125-1127.
  27. L.K.J. Vandamme, R. Alabedra, M. Zommiti: 1/f Noise as a reliability estimation for solar cells. Solid-State Electron. 26 (1983) 671-674.
  28. L.K.J. Vandamme, R.G.M. Penning de Vries: Correlation between 1/f noise and CCD transfer inefficiency. Solid-State Electr. 28 (1985) 1049-1056.
  29. L.K.J. Vandamme, S. Oosterhoff: Annealing of ion-implanted resistors reduces the 1/f noise. J. Appl. Phys. (1986).
  30. L.K.J. Vandamme: Comments on "An exact formula for the effects of resistor geometry on current noise". IEEE Trans. Electron Devices, ED-33 (1986) 1833- 1834.
  31. L.K.J. Vandamme: Comments on "1/f Noise in metal contacts and granular resistors". IEEE Trans. Components, Hybrids, Manuf. Techn., CHMT-10 (1987) 290-291.
  32. L.K.J. Vandamme, B. Orsal: 1/f Noise in short n-p+ diffusion-current- dominated (HgCd)Te avalanche photodiodes. IEEE Trans. Electron Devices, 35 (1988) 502-506.
  33. L.K.J. Vandamme, D. Rigaud, J-M. Peransin, R. Alabedra, J-M Dumas: Gate current 1/f noise in GaAs Mesfet's. IEEE Trans. Electron Devices, 35 (1988) 1071-1075.
  34. L.K.J. Vandamme: Annealing of implants reduces lattice defects and 1/f noise. Solid State Phenomena 1and 2 (1988) 153-158.
  35. R.J. Fronen, L.K.J. Vandamme: Low-frequency intensity noise in semi-conductor lasers. IEEE Journal of Quantum Electronics, 24 (1988) 724-736.
  36. L.K.J. Vandamme: Bulk and surface 1/f noise. IEEE Trans. Electron Devices 36 (1989) 987-992.
  37. L.K.J. Vandamme: electrical Engineering in the new Netherlands educational system. European Journal of Engineering Education. 15 (1990) 45-57.
  38. J-M. Peransin, P. Vignaud, L.K.J. Vandamme. 1/f Noise in MODFET's at low drain bias. IEEE Trans. Electron Devices 37 (1990) 2250-2253.
  39. Xiaosong Li, L.K.J. Vandamme. 1/f Noise in series resistance of LDD MOSTs. Solid-State Electron. 35 (1992) 1471-1475.
  40. Xiaosong Li, L.K.J. Vandamme. 1/f Noise in MOSFET as a diagnostic tool. Solid-State Electron. 35 (1992) 1477-1481.
  41. L.K.J. Vandamme, D. Rigaud, J.-M. Peransin. Coherence between gate- and drain-current fluctuations in MESFET's and MODFET's biased in the ohmic region. IEEE Trans. Electron Devices 39 (1992) 2377-2382.
  42. Xiaosong Li, L.K.J. Vandamme. Transversal and Longitudinal noise and their coherence in MOST. IEEE Trans. Electron Devices 40 (1993) 804-810.
  43. Xiaosong Li, L.K.J. Vandamme. An explanation of 1/f noise in LDD MOSFET's from the ohmic region to saturation. Solid State Electron. 36 (1993) 1515-1521.
  44. Xiaosong Li, C. Barros, E.P. Vandamme and L.K.J. Vandamme. Parameter extraction and 1/f noise in a surface and bulk p-channel LDD MOSFET. Solid State Electron. 37 (1994) 1853-1862.
  45. E.P. Vandamme and L.K.J. Vandamme. 1/f Noise and its coherence as a diagnostic tool for quality assessment of potentiometers. IEEE Trans. Components, Packaging and Manufacturing Technology, part A vol. 17 (1994) 436-445.
  46. L.K.J. Vandamme. Noise as a diagnostic tool for quality and reliability of electron devices. IEEE Trans. Electron Devices (1994), invited, 41 (1994) 2176-2187.
  47. L.K.J. Vandamme, X. Li and D. Rigaud. 1/f Noise in MOS devices, mobility or number fluctuations? IEEE Trans. Electron Devices, invited, 41 (1994) 1936-1945.
  48. P. Hervé and L.K.J. Vandamme. General relation between refractive index and energy gap in semiconductors. Infrared Physics Technol. 35 (1994) 609-615.
  49. A.J. van Kemenade, P. Hervé and L.K.J. Vandamme. 1/f Noise in the extinction coefficient of an optical fibre. Electronics Letters 30 (1994) 1338-1339.
  50. F. Pascal, M. de Murcia, G. Lecoy and L.K.J. Vandamme. 1/f and G-R noise in AlGaAs epitaxial layers. Solid State Electron. 37 (1994) 1503-1508.
  51. P.J.L. Hervé and L.K.J. Vandamme, Empirical temperature dependence of the refractive index of semiconductors, J. Appl. Phys. 77 (1995) 5476-5477.
  52. E.P. Vandamme, L.K.J. Vandamme, C. Claeys, E. Simoen and R.J. Schreutelkamp. Impact of silicidation on the excess noise behaviour of MOS transistors, Solid-State Electron. 38 (1995) 1893-1897.
  53. E.P. Vandamme and L.K.J.Vandamme, Diagnostics of the quality of MOSFETs, Microelectronics and Reliability, 36 (1996) 1107-1112.
  54. R. van Langevelde, S. Blieck and L.K.J. Vandamme, Noise in DMOS transistors in a BICMOS-technology, IEEE Trans. Electron Devices, 43 (1996) 1243-1250.
  55. L.K.J. Vandamme, Electrical Engineering in the Dutch Educational System, Electrical Engineering Research Report no. 0 (1996) 4-11.
  56. M.A.M. Gijs, J.B. Giesbers, J.W. van Est, J. Briaire and L.K.J. Vandamme, 1/f noise in magnetic Ni80Fe20 single layers and Ni80Fe20/Cu multilayers, J. Appl. Physics 80 (1996) 2539-2541.
  57. L.K.J. Vandamme and A.J. van Kemenade, Resistance noise measurement, a better diagnostic tool to detect stress and current induced degradation, Microelectronics and Reliability, 37 (1997) 87- 93. P.J.L.Herve,L.K.J.Vandamme and L.Rin,Low-frequency noise in a hybrid photomultiplier tube,Solid-State Electron.,41(1997)663-668
  58. L.K.J. Vandamme, E.P. Vandamme and J.J. Dobbelsteen, Impact of silicon substrate, iron contamination and perimeter on saturation current and noise in n+p diodes, Solid- State Electron., 1997, in press.
  59. L.K.J. Vandamme and Xiaosong Li, Change in dc and 1/f noise characteristics of n- submicron MOSFETs due to hot-carrier degradation, Microelectron. Reliab., 1997, in press.

Contributions to international conferences with referee system
All contributions are presented by the first author. The contributions mentioned with an * are invited papers.

  1. Fourth International Conference on Physical aspects of noise in solid state devices, Noordwijkerhout, 19-11 September 1975.
    L.K.J. Vandamme: 1/f Noise of InSb point contacts at 77 K and 300 K. p.97-100.
  2. European Hybrid Micro-Electronic Conference, Bad Homburg, Germany, 2-4 May 1977.
    L.K.J. Vandamme: Criteria of low-noise thick-film resistors. Proceedings of the European Hybrid Micro-electronic Conference. p. XXIV 1-7.
  3. Fifth International Conference Noise in Physical Systems, Bad Nauheim, Germany, 13-16 March 1978.
    L.K.J. Vandamme, A.H. de Kuijper: Bulk 1/f noise in MOS transistors at low-drain-source voltage. Springer Series in Electro- physics 2 (1978) 152-156.
  4. Fourteenth International Conference on the Physics of Semiconductors, Edinburgh, UK, 4-8 September 1978.
    F.N. Hooge, L.K.J. Vandamme: On the origin of 1/f noise, Inst. Phys. Conference Ser. no. 43 (1979) 565-568.
  5. Ninth European Solid State Device Research Conference ESSDERC 1979, fourth Symposium on Solid State Device Technology, Münich, Germany, 10-14 September 1979.
    L.K.J. Vandamme: 1/f Noise in MOS transistors.
  6. * Second International Symposium on 1/f Noise, Florida (Gaines-ville) USA, 17-20 March 1980.
    L.K.J. Vandamme: Mobility fluctuation model of 1/f noise in MOSFETs. Proc. 1/f Symposium, Gainesville USA, 228-243.
  7. Sixth International Conference on Noise in Physical Systems, Gaithersburg, USA, 6-10 April 1981.
    L.K.J. Vandamme, L.S.H. Dik: 1/f Noise and surface state density. Proc. NBS Special publication 614, 244-247.
  8. Eleventh International Conference on Electric Contact Phenomena, Berlin, Germany, 7-11 June 1982.
    L.K.J. Vandamme: Contact noise as a diagnostic tool.
    11. ITK Elektrische Kontakte, VDE-Verlag 60-63.
  9. * Seventh International Conference on "Noise in Physical Systems" and third International Conference on "1/f Noise", Montpellier, France, 17-20 May 1983.
    L.K.J. Vandamme: Is the 1/f noise parameter a a constant ?
    Noise in Physical Systems and 1/f Noise. Elsevier Science Publ. BV 1983, 183-192.
  10. Seventh International Conference on "Noise in Physical Systems" and third International Conference on "1/f Noise", Montpellier, France, 17-20 May 1983.
    L.K.J. Vandamme, L.J. van Ruyven: 1/f Noise as a reliability test for diode lasers.
    Noise in Physical Systems and 1/f Noise. Elsevier Science Publ. BV 1983, 245-247.
  11. * IEE Colloquium on "Low frequency noise in silicon devices", London, UK, 9 March 1984.
    L.K.J. Vandamme: Theories and experimental facts on 1/f noise.
    Colloquium Digest no. 1984/26, 4/1-4/5.
  12. Eighth International Conference on Noise in Physical Systems, fourth International Conference on 1/f Noise, Rome, Italy, 9-13 September 1985.
    L.K.J. Vandamme, J.R. de Boer: 1/f Noise in the light output of laser diodes.
    Elsevier Science Publ. BV 1986, 381-384.
  13. Eighth International Conference on Noise in Physical Systems, fourth International Conference on 1/f Noise, Rome, Italy, 9-13 September 1985.
    J.R. de Boer, L.K.J. Vandamme: Correlation between 1/f noise in laser diodes.
    Elsevier Science Publ. BV 1986, 385-388.
  14. Ninth International Conference on Noise in Physical Systems (including 1/f noise and noise in biological systems and membranes), Montreal, Canada, 25-29 May 1987.
    L.K.J. Vandamme, B. Orsal: 1/f Noise Hg0.56 Cd0.44 Te avalanche photodiodes. World Scientific 1987, 449-452.
  15. Ninth International Conference on Noise in Physical Systems (including 1/f noise and noise in biological systems and membranes), Montreal, Canada, 25-29 May 1987.
    L.K.J. Vandamme, D. Rigaud, J-M. Peransin, R. Alabedra, J-M. Dumas: 1/f Noise in the gate current of GaAs MESFETs. World Scientific 1987, 445-448.
  16. Ninth International Conference on Noise in Physical Systems (including 1/f noise and noise in biological systems and membranes), Montreal, Canada, 25-29 May 1987.
    R.J. Fronen, L.K.J. Vandamme: 1/f Noise in the light output of 0.8 mm and 1.3 mm laser diodes. World Scientific 1987, 187-190.
  17. Eighteenth European Solid State Device Research Conference. ESSDERC 1988, Montpellier, France, 13-16 September 1988.
    L.K.J. Vandamme: Spatial distribution of 1/f noise source.
    Journal de Physique colloque C4 supplément au no. 9 Tome 49, 1988, c4-157, c4-160.
  18. Tenth International Conference on Noise in Physical Systems, Budapest, August 1989.
    L.K.J. Vandamme: 1/f Noise in CMOS transistors.
    Noise in Physical Systems, ed. A. Ambrozy, Akadémiai Kiadó, Budapest, 1990, 491-494.
  19. Fifth International Confernce on Quality in Electronic Components, Bordeaux, France, 7-10 October 1991.
    L.K.J. Vandamme, D. Rigaud, R. Alabdra: Coherence between current fluctuations in FET's as a diagnostic tool. Adera 1991, 433-438.
  20. Twelfth International Conference on Noise in Physical Systems and 1/f fluctuations, Kyoto, Japan, 1991.
    L.K.J. Vandamme, D. Rigaud, J.M. Peransin: Coherence in gate and drain current fluctuations of MES- and MODFET.. ed. T. Musha, S. Sato and M. Yamamoto, Ohmsha 1991, 273-276.
  21. Twelfth International Conference on Noise in Physical Systems and 1/f fluctuations, Kyoto, Japan, 1991.
    Xiaosong Li, L.K.J. Vandamme: Study of transversal and longitudinal noise in MOST. ed. T. Musha, S. Sato and M. Yamamoto, Ohmsha 1991, 277-280.
  22. Twelfth International Conference on Noise in Physical Systems and 1/f fluctuations, Kyoto, Japan, 1991.
    S. Kibeya, B. Orsal, R. Alabedra, L.K.J. Vandamme: Noise in superlattice avalanche photodiodes. ed. T. Musha, S. Sato and M. Yamamoto, Ohmsha 1991, 325-329.
  23. Third European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 1992), Schwäbisch Gmünd, Germany, 5-8 October 1992.
    L.K.J. Vandamme, A. van Kemenade: Resistance noise measurement, a better tool to detect stress and current-induced degradation. VDE-Verlag Berlinm 1992, 419-420.
  24. Noise in Physical Systems and 1/f Fluctuations, St. Louis, USA, August 1993.
    L.K.J. Vandamme, X. Li and D. Rigaud: 1/f Noise in MOS transistors due to number of mobility fluctuations, AIP Conference Proceedings no. 285 (AIP Press,New York 1993), 345-353.
  25. Noise in Physical Systems and 1/f Fluctuations, St. Louis, USA, August 1993.
    X. Li and L.K.J. Vandamme: A study of 1/f noise in LDD MOSFETs, AIP Conference Proceedings. no. 285 (AIP Press,New York 1993), 370-373.
  26. Noise in Physical Systems and 1/f Fluctuations, St. Louis, USA, August 1993.
    A. Hoffmann, M. Valenze, D. Rigaud and L.K.J. Vandamme: Radiation effects on radiation hardened LDD CMOS transistors. AIP Conference Proceedings no. 285 (AIP Press, New York 1993) 362-365.
  27. Noise in Physical Systems and 1/f Fluctuations, St. Louis, USA, August 1993.
    M. de Murcia, F. Pascal, G. Lecoy and L.K.J. Vandamme: Excess noise in Al0.25Ga0.75As epitaxial layers, AIP Conference Proceedings no. 285 (AIP Press, New York 1993) 31-34.
  28. Noise in Physical Systems and 1/f Fluctuations, St. Louis, USA, August 1993.
    L.K.J. Vandamme, S. Kibeya, B. Orsal and R. Alabedra: 1/f Noise and thermal noise ofa GaAs/Al0.4Ga0.6As supperlattice, AIP Conference Proceedings no. 285 (AIP Press, New York 1993) 324-328.
  29. * 6th Int. Conf. Quality in Electronic Components Failure Prevention, Detection and Analysis. Bordeaux, 4-7 October 1993.
    L.K.J. Vandamme and F.N. Hooge: 1/f Noise as a diagnostic tool for quality evaluation of electronic devices. (ESREF 93) 323-333.
  30. OPTO '94. Paris, 26-28 Avril 1994.
    P. Hervé and L.K.J. Vandamme: A relation between refractive index and energy bandgap applied to GaxIn1-xAsyP1-y, (ESI Publications - optoelectronique) 371 - 374.
  31. 5th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis. Glasgow, 4-7 October 1994.
    E.P. Vandamme and L.K.J. Vandamme: Reliability assessment of potentiometers by 1/f noise analysis, (ESREF 94) 327-330.
  32. 5th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis. Glasgow, 4-7 October 1994.
    X. li and L.K.J. Vandamme: Normalised 1/f noise: a more sensitive diagnostic tool for hot-carrier degradation in sub-micron MOSFET's, (ESREF 94) 131-134
  33. * 13th International Conference on Noise in Physical Systems and 1/f Fluctuations, ICNF'95, Palanga, Lithuania, 1995.
    L.K.J. Vandamme: The gate voltage dependence of the 1/f noise parameter a in MOS transistors, 397-403.
  34. 13th International Conference on Noise in Physical Systems and 1/f Fluctuations, ICNF'95, Palanga, Lithuania, 1995.
    P.J.L. Hervé and L.K.J. Vandamme: 1/f noise in optical fibers, 517-520.
  35. 13th International Conference on Noise in Physical Systems and 1/f Fluctuations, ICNF'95, Palanga, Lithuania, 1995.
    L. Ren, P.J.L. Hervé and L.K.J. Vandamme: Shot noise in a hybrid photomultiplier tube, 521- 524.
  36. OPTO '95. Paris, 28-30 Mars 1995.
    P.J.L. Hervé, E.F. Dierikx and L.K.J. Vandamme: Low-frequency 1/f intensity noise and spectral linewidth, (ESI Publications - optoelectronique) 71-73.
  37. * International Workshop Noise and Reliability of Semiconductor Devices. Brno, CZ, July 18-20 1995.
    L.K.J. Vandamme: Noise spectroscopy for quality and reliability assessment of materials and devices, 39-44.
  38. Second ELEN Workshop. Grenoble, France, October 25-27 1995.
    L.K.J. Vandamme and E.P. Vandamme: Impact of silicon substrates, iron contamination and perimeter on saturation current and 1/f noise in n+p diodes, 502.1-502.16.
  39. 1st Internat. Conference on Unsolved Problems of Noise, (UPON '96), Sept. '96, Szeged, Hungary,
    L.K.J. Vandamme, The role of intergrain contacts in the resistance noise of HTSC, proceedings, of the 1st Internat. Conference on Usolved Problems of Noise, eds. Ch. Doering, L.B. Kiss and M.F. Shlesinger, World Scientific Signapore, pp. 279-283.
  40. 1st International Conference on Unsolved problems on Noise (UPON '96), Szeged, Sept. '96.
    J. Briaire, L.K.J. Vandamme, K.M. Schep, J.B. Giesers and M.A.M. Gijs: Noise and magnetic domain structure in NiFe thin films. Proc. of the 1st UPON '96, eds. Ch. Doering, L.B. Kiss and M.F. Schlesinger, World Scientific, Signapore, pp 147-151.
  41. 1st International Conference on Unsolved problems on Noise (UPON '96), Szeged, Sept. '96.
    L.B. Kiss, P. Svedlindh, L.K.J. Vandamme, C.M. Muirhead, Z. Ivanov and T. Claeson: Current controlled percolation exponents in the noise of high-temperature super conductor thin films, Proc. of the 1st UPON '96, eds. Ch. Doering, L.B. Kiss and M.F. Schlesinger, World Scientific, Signapore, pp 284-289.
  42. Third ELEN Workshop Leuven, Belgium, November 5-7, 1996.
    P.J.L. Hervé and L.K.J. Vandamme: Low-frequency noise in polymer light-emitting diode, pp. 26- 31.
  43. Third ELEN Workshop Leuven, Belgium, November 5-7 1996.
    J. Briaire, L.K.J. Vandamme and M.A.M. Gijs: 1/f Noise dependence on magnetic field in single Ni80Fe20 and Ni80Fe20/Cu multilayers, pp. 39-44.
  44. Third ELEN Workshop Leuven, Belgium, November 5-7 1996.
    L.B. Kiss, P. Svedlindh, L.K.J. Vandamme, C.M. Muirhead and Z. Ivanov: Current controlled percolation exponents in the noise of high-temperature super conductor thin films, pp. 55-59.
  45. Third ELEN Workshop Leuven, Belgium, November 5-7 1996.
    L.K.J. Vandamme, Z. Gingl and D. Sodini: The influence of inhomogeneous carrier-density of the dependence of resistance and noise on gate voltage, pp. 73-77.
  46. Third ELEN Workshop Leuven, Belgium, November 5-7 1996.
    L.K.J. Vandamme and Z. Gingl: A spatial non uniform 1/f source explains the noise versus gate voltage dependence in n-MOSTs, pp. 129-133.
  47. * 14th International conference on Noise in Physical Systems and 1/f Fluctuations (ICNF) 1997, Leuven Belgium,
    L.K.J. Vandamme, P.J.L Hervé and R. Alabedra, A decade of low frequency noise in optoelectronic and photonic components, in press.
  48. 14th International conference on Noise in Physical Systems and 1/f Fluctuations (ICNF) 1997, Leuven Belgium,
    P.J.L Hervé, L.K.J. Vandamme, and P.W.M. Blom, Low frequency noise in polymer light-emitting diodes, in press.
  49. 14th International conference on Noise in Physical Systems and 1/f Fluctuations (ICNF) 1997, Leuven Belgium,
    L.K.J. Vandamme, D. Sodini and Z. Gingl, On the relative amplitude of RTS noise, in press.
  50. 14th International conference on Noise in Physical Systems and 1/f Fluctuations (ICNF) 1997, Leuven Belgium,
    J. Briaire, L.K.J. Vandamme, and M.A.M. Gijs, Noise in NiFe thn films, in press.

Conferences on invitation outside the Unversity.

  1. L.K.J. Vandamme: Model voor 1/f ruis in MOS transistoren. Katholieke Universiteit Leuven, Belgium, January 10th, 1978.
  2. L.K.J. Vandamme: Bruit en 1/f. Université des Sciences et Techniques du Languedoc, Montpellier, France, November 26th, 1981.
  3. L.K.J. Vandamme: Le bruit en 1/f. Fluctuations de mobilité ou du nombre de porteurs ? Institut National Polytechnique de Grenoble, Laboratoire de physique des composants à semiconducteurs, Grenoble, France, June 17th, 1982.
  4. L.K.J. Vandamme: 1/f Noise. Landis & Gyr, Zug, Switzerland, April 13th, 1984.
  5. L.K.J. Vandamme: Contact ruis. Philips, Roeselare, Belgium, October 15th, 1984.
  6. L.K.J. Vandamme: New educational system in the Netherlands: Electrical Engineering. Journées CEE-EEA, Reims, France, March 16-17th, 1989.
  7. L.K.J. Vandamme: L'enseignement supérieur aux Pays-Bas. Université des Sciences et Techniques du Languedoc, Montpellier, France, January 18th, 1990.
  8. L.K.J. Vandamme: Evolution of education in the Netherlands. European Conference on Education of Electrical and Information Engineers, Vigo, Spain, February 28th- March 2nd, 1990.
  9. L.K.J. Vandamme: Système éducatif aux Pays-Bas. ENSEHT, Toulouse, France, May 21st, 1990.
  10. L.K.J. Vandamme: Theories and facts on 1/f noise. Technical University, Brno, Czech Republic, September 21st, 1990.
  11. L.K.J. Vandamme: Education in the Netherlands: Electrical and Information Engineering. Technical University, Prague, Czech Republic, September 18th, 1990.
    Technical University, Brno, Czech Republic, September 24th, 1990.
  12. L.K.J. Vandamme: Noise in CMOS transistors. ESPRIT meeting, Grenoble, France, 1990.
  13. L.K.J. Vandamme: Series resistances in MOS transistors. ESPRIT meeting, Lille, France, 1991.
  14. L.K.J. Vandamme: 1/f Noise as a diagnostic tool for quality evaluation. ESPRIT 7236- ADEQUAT Meeting on Electromigration, Delft, The Netherlands, October 27th, 1993.
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